The combination of electron microprobe x-ray emission spectrometry with the scanning techniques first developed for the scanning electron microscope permits using the scanning electron probe as a microscope sensitive to elemental composition. This techni
VolumeNBS Technical Note 278 Year1967 Pages50 Possible copyright statusNBS/NIST Technical Notes are a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. However, please pay special attention to the individual works to make sure there are no copyright restrictions indicated. Individual works may require securing other permissions from the original copyright holder. LanguageEnglish Call numberQC100 .U5753 no.278 Digitizing sponsorNIST Research Library Book contributorNIST Research Library CollectionNISTTechNotes; NISTresearchlibrary; fedlink; americana NotesNo copyright page found. No table-of-contents pages found.
byRanda, James; Lahtinen, Janne; Camps, Adriano; Gasiewski, A. J.; Hallikainen, Martti; Le Vine, David M.; Martin-Neira, Manuel; Piepmeier, Jeff; Rosenkranz, Philip W.; Ruf, Christopher S.; Shiue, James; Skou, Niels.